Cite
HARVARD Citation
Sønsteby, H. et al. (2018). In situ synchrotron X-ray diffraction of thin films under perturbation by an electric field. Ferroelectrics. pp. 20-26. [Online].
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Sønsteby, H. et al. (2018). In situ synchrotron X-ray diffraction of thin films under perturbation by an electric field. Ferroelectrics. pp. 20-26. [Online].