Study of VO2 thin film synthesis by atomic layer deposition. (June 2019)
- Record Type:
- Journal Article
- Title:
- Study of VO2 thin film synthesis by atomic layer deposition. (June 2019)
- Main Title:
- Study of VO2 thin film synthesis by atomic layer deposition
- Authors:
- Prasadam, V.P.
Dey, B.
Bulou, S.
Schenk, T.
Bahlawane, N. - Abstract:
- Abstract: Vanadium dioxide emerges as an appealing material for smart thermal management and electrical/optical switching owing to its abrupt semiconductor-to-metal transition (SMT) at near room temperature. The application potential of this material should be leveraged by the implementation of the atomic layer deposition (ALD), a method that enables an unequaled control over the thickness and film conformality on complex substrate structures by virtue of self-limiting growth mechanism. Here, the vanadium oxide thin films are synthesized from vanadyl (V) triisopropoxide (VTOP) as the vanadium precursor and H2 O as the reactant. The thermal decomposition threshold of VTOP was observed at 90 °C, and temperature window with a constant growth rate was observed at 50–90 °C. The saturation behavior of the ALD half reactions was demonstrated at 80 °C, yielding the optimized ALD cycle conditions of 8 s VTOP/15 s purge/6 s H2 O/15 s purge with a growth rate of 0.047 nm/cycle. The as-grown amorphous films convert into VO2 via a 4-h heat treatment under 10 −5 mbar at 550 °C. The formed VO2 features a sudden and reversible change in the total hemispherical reflectance in UV-VIS-NIR region at 68 °C, confirming its SMT behavior. The conversion process induces, however, a surface roughening, which was considerably suppressed by a postdeposition treatment in plasma environment prior the annealing treatment. Highlights: Vanadium oxide atomic layer deposition is performed via the thermalAbstract: Vanadium dioxide emerges as an appealing material for smart thermal management and electrical/optical switching owing to its abrupt semiconductor-to-metal transition (SMT) at near room temperature. The application potential of this material should be leveraged by the implementation of the atomic layer deposition (ALD), a method that enables an unequaled control over the thickness and film conformality on complex substrate structures by virtue of self-limiting growth mechanism. Here, the vanadium oxide thin films are synthesized from vanadyl (V) triisopropoxide (VTOP) as the vanadium precursor and H2 O as the reactant. The thermal decomposition threshold of VTOP was observed at 90 °C, and temperature window with a constant growth rate was observed at 50–90 °C. The saturation behavior of the ALD half reactions was demonstrated at 80 °C, yielding the optimized ALD cycle conditions of 8 s VTOP/15 s purge/6 s H2 O/15 s purge with a growth rate of 0.047 nm/cycle. The as-grown amorphous films convert into VO2 via a 4-h heat treatment under 10 −5 mbar at 550 °C. The formed VO2 features a sudden and reversible change in the total hemispherical reflectance in UV-VIS-NIR region at 68 °C, confirming its SMT behavior. The conversion process induces, however, a surface roughening, which was considerably suppressed by a postdeposition treatment in plasma environment prior the annealing treatment. Highlights: Vanadium oxide atomic layer deposition is performed via the thermal hydrolysis of vanadyl triisopropoxide (VTOP) at 50–90 °C. The VTOP thermolysis is revealed at and above 100 °C. Highly conformal vanadium oxide is reported on carbon nanotubes. Heat treatment at 550 °C yields VO2 with a strong semiconductor-to-metal transition behavior. Plasma and thermal treatments yield VO2 with low impact of the surface morphology. … (more)
- Is Part Of:
- Materials today chemistry. Volume 12(2019)
- Journal:
- Materials today chemistry
- Issue:
- Volume 12(2019)
- Issue Display:
- Volume 12, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 12
- Issue:
- 2019
- Issue Sort Value:
- 2019-0012-2019-0000
- Page Start:
- 332
- Page End:
- 342
- Publication Date:
- 2019-06
- Subjects:
- ALD -- Vanadyl triisopropoxide -- Vanadium dioxide -- Semiconductor-to-metal transition
Chemistry -- Periodicals
Materials -- Research -- Periodicals
Materials science -- Periodicals
Chemistry
Materials -- Research
Electronic journals
Periodicals
660.282 - Journal URLs:
- https://www.journals.elsevier.com/materials-today-chemistry ↗
http://www.sciencedirect.com/science/journal/24685194 ↗
http://www.sciencedirect.com/ ↗ - DOI:
- 10.1016/j.mtchem.2019.03.005 ↗
- Languages:
- English
- ISSNs:
- 2468-5194
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
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