Analysis of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission. (18th September 2011)

• Record Type: Journal Article
• Authors: Frey, Alyssa A.; Wozniak, Nicholas R.; Nagi, Timothy B.; Keller, Matthew P.; Lunderberg, J. Mark; Peaslee, Graham F.; DeYoung, Paul A.; Hampton, Jennifer R.
• Other Names: Molina Angela Academic Editor.
• Is Part Of: International journal of electrochemistry. Volume 2011(2011)
• Publication Date: 2011-09-18
• Subjects: Electrochemistry -- Periodicals; Electrochemistry; Periodicals; 660.297
• DOI: 10.4061/2011/604395
• Languages: English
• ISSNs: 2090-3529

Abstract

Abstract : The elemental composition of electrodeposited NiFe thin films was analyzed with particle-induced X-ray emission (PIXE). The thin films were electrodeposited on polycrystalline Au substrates from a 100 mM NiSO4, 10 mM FeSO4, 0.5 M H3 BO3, and 1 M Na2 SO4 solution. PIXE spectra of these films were analyzed to obtain relative amounts of Ni and Fe as a function of deposition potential and deposition time. The results show that PIXE can measure the total deposited metal in a sample over at least four orders of magnitude with similar fractional uncertainties. The technique is also sensitive enough to observe the variations in alloy composition due to sample nonuniformity or variations in deposition parameters.