X‐ray phase‐contrast imaging with engineered porous materials over 50 keV. (12th June 2018)

• Record Type: Journal Article
• Authors: Wang, Hongchang; Cai, Biao; Pankhurst, Matthew James; Zhou, Tunhe; Kashyap, Yogesh; Atwood, Robert; Le Gall, Nolwenn; Lee, Peter; Drakopoulos, Michael; Sawhney, Kawal
• Is Part Of: Journal of synchrotron radiation. Volume 25:Part 4(2018)
• Page Start: 1182
• Page End: 1188
• Publication Date: 2018-06-12
• Subjects: X‐ray phase imaging -- speckle technique -- hard X‐rays -- random attenuation masks -- high‐energy regions -- porous materials; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577518005623
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : Engineered porous materials are proposed as random absorption masks for X‐ray phase‐contrast imaging in high‐energy regions ( i.e. over 50 keV). Abstract : X‐ray phase‐contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high‐energy regions ( i.e. over 50 keV). Here, the authors perform X‐ray phase‐contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X‐ray phase‐contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.