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HARVARD Citation
Kitahara, K. et al. (2011). Characterization of Defects and Stress in Polycrystalline Silicon Thin Films on Glass Substrates by Raman Microscopy. International journal of spectroscopy. p. . [Online].
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Kitahara, K. et al. (2011). Characterization of Defects and Stress in Polycrystalline Silicon Thin Films on Glass Substrates by Raman Microscopy. International journal of spectroscopy. p. . [Online].