Compact Silicon Waveguide Mode Converter Employing Dielectric Metasurface Structure. Issue 4 (14th December 2018)

• Record Type: Journal Article
• Authors: Wang, Hongwei; Zhang, Yong; He, Yu; Zhu, Qingming; Sun, Lu; Su, Yikai
• Is Part Of: Advanced optical materials. Volume 7:Issue 4(2019)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2018-12-14
• Subjects: dielectric metasurface -- integrated devices -- mode converters -- silicon; Optical materials -- Periodicals; Photonics -- Periodicals; 620.11295
• DOI: 10.1002/adom.201801191
• Languages: English
• ISSNs: 2195-1071

Abstract

Abstract: Mode converters are key components in on‐chip mode‐division multiplexing systems. A compact silicon waveguide mode converter is proposed and demonstrated using all‐dielectric metasurface structure with a tilted subwavelength periodic perturbation. The proposed waveguide mode converter can be scaled to realize arbitrary waveguide mode conversion. As examples, two waveguide mode converters are experimentally demonstrated on a silicon‐on‐insulator wafer, which can convert the TE0 mode to the TE1 mode and the TE2 mode with coupling lengths of 5.75 and 6.736 µm, respectively. The conversion losses of <1 dB and crosstalk values of <−10 dB are achieved for both the TE0 ‐to‐TE1 and the TE0 ‐to‐TE2 mode converters. Abstract : A compact silicon waveguide mode converter is proposed and demonstrated using all‐dielectric metasurface structure with a tilted subwavelength periodic perturbation. As examples, two waveguide mode converters are experimentally demonstrated on a silicon‐on‐insulator wafer, which can convert the TE0 mode to the TE1 mode and the TE2 mode with coupling lengths of 5.75 and 6.736 µm, respectively.