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HARVARD Citation
Zhang, W. et al. (2015). Fatigue life and resistance analysis of COG assemblies under hygrothermal aging. Microelectronics and reliability. 55 (3), pp. 623-629. [Online].
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Zhang, W. et al. (2015). Fatigue life and resistance analysis of COG assemblies under hygrothermal aging. Microelectronics and reliability. 55 (3), pp. 623-629. [Online].