Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates. (20th November 2017)

• Record Type: Journal Article
• Authors: Zhang, Hao; Li, Xianqi; Chen, Yunmei; Park, Jewook; Li, An-Ping; Zhang, X.-G.
• Other Names: Zhao Ying Academic Editor.
• Is Part Of: Scanning. Volume 2017(2017)
• Publication Date: 2017-11-20
• Subjects: Scanning electron microscopy -- Periodicals; 502.825
• DOI: 10.1155/2017/1097142
• Languages: English
• ISSNs: 0161-0457

Abstract

Abstract : We present an image postprocessing framework for Scanning Tunneling Microscope (STM) to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a "rubber band" model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA). The numerical results on measurement from copper(111) surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.