A TM-Pass/TE-Stop Polarizer Based on a Surface Plasmon Resonance. (2nd August 2010)

• Record Type: Journal Article
• Authors: Wakabayashi, Yuu; Yamauchi, Junji; Nakano, Hisamatsu
• Other Names: Vukovic Ana Academic Editor.
• Is Part Of: Advances in optoelectronics. Volume 2011(2011)
• Publication Date: 2010-08-02
• Subjects: Optoelectronics -- Periodicals; Optoélectronique; Optoelectronics; Periodicals; 621.381045
• DOI: 10.1155/2011/867271
• Languages: English
• ISSNs: 1687-563X

Abstract

Abstract : A TM-pass/TE-stop polarizer consisting of a metal film sandwiched between dielectric gratings is investigated using the finite-difference time-domain method. At normal incidence with respect to the grating plane, a transmissivity of more than 94% and a reflectivity of more than 98% are obtained atλ = 1.55 μ m for the TM and TE waves, respectively. The extinction ratio is more than 17 dB over a wavelength range of 1.50 μ m to 1.75 μ m. A high extinction ratio is maintained at oblique incidence, although the wavelength range shifts towards longer wavelengths. The TM-pass/TE-stop operation is also achieved with a modified structure, in which a dielectric grating is sandwiched between metal films.