Analysis of the Interference Modulation Depth in the Fourier Transform Spectrometer. (4th October 2015)

• Record Type: Journal Article
• Authors: Liu, Rilong
• Other Names: Norgia Michele Academic Editor.
• Is Part Of: Advances in optoelectronics. Volume 2015(2015)
• Publication Date: 2015-10-04
• Subjects: Optoelectronics -- Periodicals; Optoélectronique; Optoelectronics; Periodicals; 621.381045
• DOI: 10.1155/2015/472852
• Languages: English
• ISSNs: 1687-563X

Abstract

Abstract : Based on the principle of the Michelson interferometer, the paper briefly describes the theoretical significance and calculates and deduces three expressions of the interference modulation depth. The influence of the surface shape error of plane mirror on modulation depth is analyzed, and the tolerance of error is also pointed out. Moreover, the dependence of modulation depth on the reflectance change of beam splitter interface is also analyzed, and the curve is given. It is concluded that this paper is of general significance for the Fourier transform spectrometer based on the principle of the Michelson two-beam interference.