Layer-by-Layer Self-Assembled Ferrite Multilayer Nanofilms for Microwave Absorption. (17th November 2015)

• Record Type: Journal Article
• Authors: Heo, Jiwoong; Choi, Daheui; Hong, Jinkee
• Other Names: Correa-Duarte Miguel A. Academic Editor.
• Is Part Of: Journal of nanomaterials. Volume 2015(2015)
• Publication Date: 2015-11-17
• Subjects: Nanostructured materials -- Periodicals; Nanotechnology -- Periodicals; Nanomatériaux; Nanostructured materials; Nanotechnology; Nanostructures; Nanotechnology; Periodicals; Fulltext; Internet Resources; Periodicals; 620.115
• DOI: 10.1155/2015/164619
• Languages: English
• ISSNs: 1687-4110

Abstract

Abstract : We demonstrate a simple method for fabricating multilayer thin films containing ferrite (Co0.5 Zn0.5 Fe2 O4 ) nanoparticles, using layer-by-layer (LbL) self-assembly. These films have microwave absorbing properties for possible radar absorbing and stealth applications. To demonstrate incorporation of inorganic ferrite nanoparticles into an electrostatic-interaction-based LbL self-assembly, we fabricated two types of films: (1) a blended three-component LbL film consisting of a sequential poly(acrylic acid)/oleic acid-ferrite blend layer and a poly(allylamine hydrochloride) layer and (2) a tetralayer LbL film consisting of sequential poly(diallyldimethylammonium chloride), poly(sodium-4-sulfonate), bPEI-ferrite, and poly(sodium-4-sulfonate) layers. We compared surface morphologies, thicknesses, and packing density of the two types of ferrite multilayer film. Ferrite nanoparticles (Co0.5 Zn0.5 Fe2 O4 ) were prepared via a coprecipitation method from an aqueous precursor solution. The structure and composition of the ferrite nanoparticles were characterized by X-ray diffraction, energy dispersive X-ray spectroscopy, transmission electron microscopy, and scanning electron microscopy. X-ray diffraction patterns of ferrite nanoparticles indicated a cubic spinel structure, and energy dispersive X-ray spectroscopy revealed their composition. Thickness growth and surface morphology were measured using a profilometer, atomic force microscope, and scanning electron microscope.