Cite
HARVARD Citation
Bufler, F. et al. (2002). Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET. VLSI design. 15 (4), pp. 715-720. [Online].
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Bufler, F. et al. (2002). Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET. VLSI design. 15 (4), pp. 715-720. [Online].