Some Like It Cold: Initial Testing Results for Cryogenic Computing Components. (February 2019)

• Record Type: Journal Article
• Authors: Kelly, Tim; Fernandez, Pedro; Vogelsang, Thomas; McKee, Sally A; Gopalakrishnan, Liji; Magee, Stephen; Padgett, Keith; Barrow, David; Rizza, Joseph; Doidge, Dennis; Wright, Kenneth L.; Hampel, Craig; Bronner, Gary
• Is Part Of: Journal of physics. Volume 1182(2019)
• Publication Date: 2019-02
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/1182/1/012004
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: With the exponential growth of bandwidth demands on present data centers, we are researching the feasibility of deploying cryogenic DRAM based memory subsystems for the next generation of higher bandwidth, more efficient, lower cost and smaller footprint data centers of the future. As part of our early research, we are designing DRAM based subsystems that operate at 77K and are submerged in liquid nitrogen. To effectively test the memory subsystem at cryogenic temperatures, creative test methods must be employed. This paper illustrates the test setups, procedures and methodologies that were used to successfully test DRAM based subsystems at cryogenic temperatures