High Definition X-Ray Fluorescence: Principles and Techniques. (26th May 2008)

• Record Type: Journal Article
• Authors: Chen, Z. W.; Gibson, Walter M.; Huang, Huapeng
• Other Names: Pina Ladislav Academic Editor.
• Is Part Of: X-ray optics and instrumentation. Volume 2008(2008)
• Publication Date: 2008-05-26
• Subjects: X-ray optics -- Periodicals; X-ray optics; Periodicals; Electronic journals; 621.361
• DOI: 10.1155/2008/318171
• Languages: English
• ISSNs: 1687-7632

Abstract

Abstract : Energy dispersive X-ray fluorescence (EDXRF) is a well-established and powerful tool for nondestructive elemental analysis of virtually any material. It is widely used for environmental, industrial, pharmaceutical, forensic, and scientific research applications to measure the concentration of elemental constituents or contaminants. The fluorescing atoms can be excited by energetic electrons, ions, or photons. A particular EDXRF method, monochromatic microfocus X-ray fluorescence (Mμ EDXRF), has proven to be remarkably powerful in measurement of trace element concentrations and distributions in a large variety of important medical, environmental, and industrial applications. When used with state-of-the-art doubly curved crystal (DCC) X-ray optics, this technique enables high-sensitivity, compact, low-power, safe, reliable, and rugged analyzers for insitu, online measurements in industrial process, clinical, and field settings. This new optic-enabled Mμ EDXRF technique, called high definition X-ray fluorescence (HD XRF), is described in this paper.