Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction. (16th July 2008)

• Record Type: Journal Article
• Authors: Misture, Scott T.
• Other Names: Gibson Walter Academic Editor.
• Is Part Of: X-ray optics and instrumentation. Volume 2008(2008)
• Publication Date: 2008-07-16
• Subjects: X-ray optics -- Periodicals; X-ray optics; Periodicals; Electronic journals; 621.361
• DOI: 10.1155/2008/408702
• Languages: English
• ISSNs: 1687-7632

Abstract

Abstract : The performance of parallel beam multilayer optics, including a parabolic multilayer Osmic MaxFlux GO-13N and a flat custom multilayer, was evaluated experimentally and compared to Bragg-Brentano and traditional ''parallel beam'' or ''thin film'' optical geometries. A novel arrangement of a parabolic multilayer in the incident beam with a flat multilayer in the diffracted beam functioning as an analyzer crystal was proven effective for powder diffraction applications. The dual-optic configuration improves resolution while eliminating sample displacement and transparency errors as expected for a configuration with equatorial divergence below 100 arcseconds. Fundamental parameters fitting showed that the parabolic multilayer can be accurately modeled using a constant Gaussian function, while a long parallel-plate soller collimator requires a constant hat function. No additional convolutions are necessary for the diffracted-beam flat multilayer because of the lower acceptance angle.