Cite
HARVARD Citation
Linton, T. et al. (2001). 3D Modelling of Fluctuation Effects in Highly Scaled VLSI Devices. VLSI design. 13 (1), pp. 103-109. [Online].
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Linton, T. et al. (2001). 3D Modelling of Fluctuation Effects in Highly Scaled VLSI Devices. VLSI design. 13 (1), pp. 103-109. [Online].