Cite
HARVARD Citation
Cattaneo, A. et al. (1977). Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors. Electrocomponent science and technology. pp. 205-211. [Online].
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Cattaneo, A. et al. (1977). Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors. Electrocomponent science and technology. pp. 205-211. [Online].