Cite
HARVARD Citation
Zhang, B. et al. (2019). Leakage analysis and ground tests of knife edge indium seal to lunar sample return devices. Proceedings of the Institution of Mechanical Engineers. pp. 2010-2022. [Online].
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Zhang, B. et al. (2019). Leakage analysis and ground tests of knife edge indium seal to lunar sample return devices. Proceedings of the Institution of Mechanical Engineers. pp. 2010-2022. [Online].