Cite
HARVARD Citation
Lefort, R. et al. (n.d.). Machine learning-based tools to model and to remove the off-target effect. Pattern analysis and applications. 20 (1), pp. 87-100. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Lefort, R. et al. (n.d.). Machine learning-based tools to model and to remove the off-target effect. Pattern analysis and applications. 20 (1), pp. 87-100. [Online].