Cite
HARVARD Citation
Arun, N. et al. (2019). Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO2-based RRAM devices. Radiation effects and defects in solids. 174 (1), pp. 66-75. [Online].
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Arun, N. et al. (2019). Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO2-based RRAM devices. Radiation effects and defects in solids. 174 (1), pp. 66-75. [Online].