Radiation induced nanovoid shrinkage in Cu at room temperature: An in situ study. (June 2019)

• Record Type: Journal Article
• Authors: Fan, C.; Sreekar, A.R.G.; Shang, Z.; Li, Jin; Li, M.; Wang, H.; El-Azab, A.; Zhang, X.
• Is Part Of: Scripta materialia. Number 166(2019)
• Page Start: 112
• Page End: 116
• Publication Date: 2019-06
• Subjects: Nanovoids -- In situ radiation -- Void shrinkage -- Stacking fault tetrahedron -- Phase-field modeling; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2019.02.046
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract: Radiation induced void swelling is widely observed in a variety of metallic materials. Here, by using sputtering deposition technique, we have introduced faceted nanovoids into Cu films. In-situ Kr ion irradiation was subsequently performed at room temperature to investigate the evolution of nanovoids. Most nanovoids found to shrink gradually with increasing dose. Irradiation induced high-density vacancy clusters exist mostly in the form of stacking fault tetrahedrons. Phase field modeling reveales that void shrinkage arises from biased absorption of interstitials. These findings provide insights to the physical mechanisms of radiation response of nanovoids in metallic materials. Graphical abstract: Unlabelled Image