Cite
HARVARD Citation
Simbrunner, J. et al. (2019). Indexing grazing‐incidence X‐ray diffraction patterns of thin films: lattices of higher symmetry. Journal of applied crystallography. 52 (2), pp. 428-439. [Online].
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Simbrunner, J. et al. (2019). Indexing grazing‐incidence X‐ray diffraction patterns of thin films: lattices of higher symmetry. Journal of applied crystallography. 52 (2), pp. 428-439. [Online].