Cite
HARVARD Citation
Cheng, S. et al. (2019). Revealing the Effects of Trace Oxygen Vacancies on Improper Ferroelectric Manganite with In Situ Biasing. Advanced Electronic Materials. p. n/a. [Online].
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Cheng, S. et al. (2019). Revealing the Effects of Trace Oxygen Vacancies on Improper Ferroelectric Manganite with In Situ Biasing. Advanced Electronic Materials. p. n/a. [Online].