Cite
HARVARD Citation
Nagy, D. et al. (2015). The effect of interface roughness scattering on Si SOI FinFET with Ando's and extended Prange and Nee model. Journal of physics. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Nagy, D. et al. (2015). The effect of interface roughness scattering on Si SOI FinFET with Ando's and extended Prange and Nee model. Journal of physics. p. . [Online].