Transmission electron microscopy of a model crystalline organic, theophylline. (September 2015)

• Record Type: Journal Article
• Authors: Cattle, J; S'ari, M; Hondow, N; Abellán, P; Brown, A P; Brydson, R M D
• Is Part Of: Journal of physics. Number 644(2015)
• Publication Date: 2015-09
• Subjects: Physics -- Congresses; 530.5
• DOI: 10.1088/1742-6596/644/1/012030
• Languages: English
• ISSNs: 1742-6588

Abstract

Abstract: We report on the use of transmission electron microscopy (TEM) to analyse the diffraction patterns of the model crystalline organic theophylline to investigate beam damage in relation to changing accelerating voltage, sample temperature and TEM grid support films. We find that samples deposited on graphene film grids have the longest lifetimes when also held at -190 °C and imaged at 200 kV accelerating voltage. Finally, atomic lattice images are obtained in bright field STEM by working close to the estimated critical electron dose for theophylline.