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HARVARD Citation
Villena, M. et al. (2015). An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs. Solid-state electronics. pp. 47-51. [Online].
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Villena, M. et al. (2015). An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs. Solid-state electronics. pp. 47-51. [Online].