Stack of Timepix-based detectors with Si, GaAs:Cr and CdTe sensors with optimized thickness for spectral CT. (28th February 2019)

Record Type:: Journal Article
Title:: Stack of Timepix-based detectors with Si, GaAs:Cr and CdTe sensors with optimized thickness for spectral CT. (28th February 2019)
Main Title:: Stack of Timepix-based detectors with Si, GaAs:Cr and CdTe sensors with optimized thickness for spectral CT
Authors:: Kozhevnikov, D.
Smolyanskiy, P.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 14:Number 2(2019)
Journal:: Journal of instrumentation
Issue:: Volume 14:Number 2(2019)
Issue Display:: Volume 14, Issue 2 (2019)
Year:: 2019
Volume:: 14
Issue:: 2
Issue Sort Value:: 2019-0014-0002-0000
Page Start:: C02010
Page End:: C02010
Publication Date:: 2019-02-28
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/14/02/C02010 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 9725.xml