Cite
HARVARD Citation
Thielen, M. et al. (2019). In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth. International journal of fatigue. pp. 155-162. [Online].
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Thielen, M. et al. (2019). In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth. International journal of fatigue. pp. 155-162. [Online].