Residual stress determination of silicon containing boron dopants in ceramic matrix composites. Issue 5 (8th October 2018)

• Record Type: Journal Article
• Authors: Knauf, Michael W.; Przybyla, Craig P.; Ritchey, Andrew J.; Trice, Rodney W.; Pipes, R. Byron
• Is Part Of: Journal of the American Ceramic Society. Volume 102:Issue 5(2019)
• Page Start: 2820
• Page End: 2829
• Publication Date: 2018-10-08
• Subjects: Ceramics -- Periodicals; 620.1405
• DOI: 10.1111/jace.15942
• Languages: English
• ISSNs: 0002-7820

Abstract

Abstract: Raman spectroscopy was utilized to investigate residual stresses found within a SiC/SiC ceramic matrix composite containing Hi‐Nicalon™ fibers, a slurry melt‐infiltrated matrix of silicon carbide particles, and silicon matrix. Large gradients of electrically active boron are found throughout various regions within the crystalline lattice of the silicon matrix. The regions were identified by the varying degrees of asymmetry and peak width measured in the resonant Fano profile of the doped silicon. A methodology to determine the residual stress state of silicon exhibiting varying degrees of electrically active boron is presented by utilizing the changes in the Raman profile parameters. Previous works on similar SiC/SiC CMCs have attributed spatial gradients in the wavenumber to large fluctuations in stress. By applying the proposed methodology, we show that these observations are related to active boron that is segregated in various matrix areas. Utilizing this methodology, mean compressive stresses in various silicon regions were found to be approximately 300 MPa, with complementary tensile silicon carbide particle stresses of approximately 300 MPa.