Cite
HARVARD Citation
Lin, P. et al. (2019). Study of two hardening mechanism caused by geometrically necessary dislocations in thin films with passivation layer. International journal of solids and structures. pp. 59-67. [Online].
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Lin, P. et al. (2019). Study of two hardening mechanism caused by geometrically necessary dislocations in thin films with passivation layer. International journal of solids and structures. pp. 59-67. [Online].