A defect-based viscoplastic model for large-deformed thin film electrode of lithium-ion battery. (April 2019)
- Record Type:
- Journal Article
- Title:
- A defect-based viscoplastic model for large-deformed thin film electrode of lithium-ion battery. (April 2019)
- Main Title:
- A defect-based viscoplastic model for large-deformed thin film electrode of lithium-ion battery
- Authors:
- Li, Yong
Zhang, Jian
Zhang, Kai
Zheng, Bailin
Yang, Fuqian - Abstract:
- Abstract: The interaction among solute atoms, local deformation velocity and viscoplasticity of host material plays a significant role in determining the stress evolution and concentration distribution in host material, especially in large-deformed electrode materials made from silicon and tin. In this work, a new viscoplastic model that describes diffusion-induced deformation is developed from the framework of the generation of defects due to the migration of solute atoms. The total flux in the diffusion equation is separated into two parts; one is the diffusion part due to the migration of solute atoms, and the other is the convection part due to the local deformation velocity in host material. Using the diffusion-convection equation, the theory of nonlinear continuum mechanics and the developed constitutive relationship, we analyze the Cauchy stress and viscoplastic deformation in a thin film Si-electrode on a "rigid" substrate numerically. The average Cauchy stress during lithiation and de-lithiation with the boundary fluxes of j0, 2j0 and 0.33j0 is calculated, and the numerical results reveal that the magnitude of compressive Cauchy stress in the thin film Si-electrode increases with the increase of the boundary flux. The numerical results are in good accord with the results from experimental study and the first principle simulation for the entire charging/discharging process. Highlights: A defect-based viscoplastic model is developed. The numerical results are inAbstract: The interaction among solute atoms, local deformation velocity and viscoplasticity of host material plays a significant role in determining the stress evolution and concentration distribution in host material, especially in large-deformed electrode materials made from silicon and tin. In this work, a new viscoplastic model that describes diffusion-induced deformation is developed from the framework of the generation of defects due to the migration of solute atoms. The total flux in the diffusion equation is separated into two parts; one is the diffusion part due to the migration of solute atoms, and the other is the convection part due to the local deformation velocity in host material. Using the diffusion-convection equation, the theory of nonlinear continuum mechanics and the developed constitutive relationship, we analyze the Cauchy stress and viscoplastic deformation in a thin film Si-electrode on a "rigid" substrate numerically. The average Cauchy stress during lithiation and de-lithiation with the boundary fluxes of j0, 2j0 and 0.33j0 is calculated, and the numerical results reveal that the magnitude of compressive Cauchy stress in the thin film Si-electrode increases with the increase of the boundary flux. The numerical results are in good accord with the results from experimental study and the first principle simulation for the entire charging/discharging process. Highlights: A defect-based viscoplastic model is developed. The numerical results are in accord with the experimental results. Plastic flow can significantly reduce the magnitudes of the stresses. … (more)
- Is Part Of:
- International journal of plasticity. Volume 115(2019:Apr.)
- Journal:
- International journal of plasticity
- Issue:
- Volume 115(2019:Apr.)
- Issue Display:
- Volume 115 (2019)
- Year:
- 2019
- Volume:
- 115
- Issue Sort Value:
- 2019-0115-0000-0000
- Page Start:
- 293
- Page End:
- 306
- Publication Date:
- 2019-04
- Subjects:
- Viscoplasticity -- Local deformation velocity -- Defect -- Large deformation
Plasticity -- Periodicals
Plasticité -- Périodiques
Plasticity
Periodicals
620.11233 - Journal URLs:
- http://www.sciencedirect.com/science/journal/07496419 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.ijplas.2018.12.001 ↗
- Languages:
- English
- ISSNs:
- 0749-6419
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4542.470000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 9546.xml