Cite
HARVARD Citation
Byeon, H. et al. (2019). Deep learning-based digital in-line holographic microscopy for high resolution with extended field of view. Optics & laser technology. pp. 77-86. [Online].
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Byeon, H. et al. (2019). Deep learning-based digital in-line holographic microscopy for high resolution with extended field of view. Optics & laser technology. pp. 77-86. [Online].