Cite
HARVARD Citation
Chen, R. et al. (2019). Simulations of the effect of an oxide on contact area measurements from conductive atomic force microscopy. Nanoscale. 11 (3), pp. 1029-1036. [Online].
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Chen, R. et al. (2019). Simulations of the effect of an oxide on contact area measurements from conductive atomic force microscopy. Nanoscale. 11 (3), pp. 1029-1036. [Online].