Cite
HARVARD Citation
Reda, H. et al. (2019). Interface characterization at nanometer scale using very high frequency ultrasounds. Composite interfaces. 26 (4), pp. 325-337. [Online].
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Reda, H. et al. (2019). Interface characterization at nanometer scale using very high frequency ultrasounds. Composite interfaces. 26 (4), pp. 325-337. [Online].