Cite
HARVARD Citation
Park, H. et al. (2019). Dynamics of bias instability in the tungsten-indium-zinc oxide thin film transistor. Journal of materials chemistry. 7 (4), pp. 1006-1013. [Online].
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Park, H. et al. (2019). Dynamics of bias instability in the tungsten-indium-zinc oxide thin film transistor. Journal of materials chemistry. 7 (4), pp. 1006-1013. [Online].