Two‐Dimensional Materials: Nanomechanical Properties of Epitaxial Silicene Revealed by Noncontact Atomic Force Microscopy (Adv. Mater. Interfaces 2/2019). Issue 2 (22nd January 2019)

• Record Type: Journal Article
• Authors: Nogami, Makoto; Fleurence, Antoine; Yamada‐Takamura, Yukiko; Tomitori, Masahiko
• Is Part Of: Advanced materials interfaces. Volume 6:Issue 2(2019)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2019-01-22
• Subjects: 2D materials -- nanomechanical properties -- nc‐AFM -- silicene -- surface stress; Materials science -- Periodicals; 620.11
• DOI: 10.1002/admi.201970014
• Languages: English
• ISSNs: 2196-7350

Abstract

Abstract : The mechanical properties of silicene, a novel 2D material made of Si atoms, are investigated by non‐contact atomic force microscopy. The flexibility of the atomic structure and the periodic strain distribution are respectively revealed in simultaneously recorded topography and dissipation images. More details can be found in article number1801278 by Makoto Nogami, Antoine Fleurence, Yukiko Yamada‐Takamura, and Masahiko Tomitori.