A new diffractometer for diffuse scattering studies on the ID28 beamline at the ESRF. (13th December 2018)
- Record Type:
- Journal Article
- Title:
- A new diffractometer for diffuse scattering studies on the ID28 beamline at the ESRF. (13th December 2018)
- Main Title:
- A new diffractometer for diffuse scattering studies on the ID28 beamline at the ESRF
- Authors:
- Girard, A.
Nguyen-Thanh, T.
Souliou, S. M.
Stekiel, M.
Morgenroth, W.
Paolasini, L.
Minelli, A.
Gambetti, D.
Winkler, B.
Bosak, A. - Abstract:
- Abstract : A new diffractometer has been built as a side station on the ID28 beamline at the ESRF. The instrument is primarily dedicated to the study of diffuse scattering in a large class of materials, ranging from strongly correlated electron systems to nanoscale‐modulated and low‐dimensional systems. Abstract : A new diffractometer is now available to the general user community at the ESRF. The new diffractometer is a side station of the high‐resolution inelastic X‐ray scattering spectrometer on beamline ID28 and is located in the same experimental hutch. Both instruments can be operated simultaneously. The new diffractometer combines a fast and low‐noise hybrid pixel detector with a variable diffraction geometry. The beam spot on the sample is 50 µm × 50 µm, where focusing is achieved by a combination of Be lenses and a KB mirror. Wavelengths from 0.5 to 0.8 Å can be used for the diffraction experiments. The setup is compatible with a variety of sample environments, allowing studies under non‐ambient conditions. The diffractometer is optimized to allow a rapid survey of reciprocal space and diffuse scattering for the identification of regions of interest for subsequent inelastic scattering studies, but can also be employed as a fully independent station for structural studies from both powder and single‐crystal diffraction experiments. Several software packages for the transformation and visualization of diffraction data are available. An analysis of data collected withAbstract : A new diffractometer has been built as a side station on the ID28 beamline at the ESRF. The instrument is primarily dedicated to the study of diffuse scattering in a large class of materials, ranging from strongly correlated electron systems to nanoscale‐modulated and low‐dimensional systems. Abstract : A new diffractometer is now available to the general user community at the ESRF. The new diffractometer is a side station of the high‐resolution inelastic X‐ray scattering spectrometer on beamline ID28 and is located in the same experimental hutch. Both instruments can be operated simultaneously. The new diffractometer combines a fast and low‐noise hybrid pixel detector with a variable diffraction geometry. The beam spot on the sample is 50 µm × 50 µm, where focusing is achieved by a combination of Be lenses and a KB mirror. Wavelengths from 0.5 to 0.8 Å can be used for the diffraction experiments. The setup is compatible with a variety of sample environments, allowing studies under non‐ambient conditions. The diffractometer is optimized to allow a rapid survey of reciprocal space and diffuse scattering for the identification of regions of interest for subsequent inelastic scattering studies, but can also be employed as a fully independent station for structural studies from both powder and single‐crystal diffraction experiments. Several software packages for the transformation and visualization of diffraction data are available. An analysis of data collected with the new diffractometer shows that the ID28 side station is a state‐of‐the‐art instrument for structural investigations using diffraction and diffuse scattering experiments. … (more)
- Is Part Of:
- Journal of synchrotron radiation. Volume 26:Part 1(2019)
- Journal:
- Journal of synchrotron radiation
- Issue:
- Volume 26:Part 1(2019)
- Issue Display:
- Volume 26, Issue 1, Part 1 (2019)
- Year:
- 2019
- Volume:
- 26
- Issue:
- 1
- Part:
- 1
- Issue Sort Value:
- 2019-0026-0001-0001
- Page Start:
- 272
- Page End:
- 279
- Publication Date:
- 2018-12-13
- Subjects:
- X‐ray diffuse scattering -- diffraction -- inelastic X‐ray scattering -- phonons -- disorder
Synchrotron radiation -- Periodicals
Free electron lasers -- Periodicals
539.73505 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1107/S16005775 ↗
http://journals.iucr.org/s/journalhomepage.html ↗
http://www.blackwell-synergy.com/openurl?genre=journal&issn=0909-0495 ↗
http://onlinelibrary.wiley.com/ ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1107/S1600577518016132 ↗
- Languages:
- English
- ISSNs:
- 0909-0495
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5068.035000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 9457.xml