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HARVARD Citation
Herfurth, N. et al. (2019). Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation. Microelectronics and reliability. pp. 73-78. [Online].
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Herfurth, N. et al. (2019). Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation. Microelectronics and reliability. pp. 73-78. [Online].