Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA. (8th January 2016)

• Record Type: Journal Article
• Authors: Fukuzawa, H; Tachibana, T; Motomura, K; Xu, W Q; Nagaya, K; Wada, S; Johnsson, P; Siano, M; Mondal, S; Ito, Y; Kimura, M; Sakai, T; Matsunami, K; Hayashita, H; Kajikawa, J; Liu, X-J; Robert, E; Miron, C; Feifel, R; Marangos, J P; Tono, K; Inubushi, Y; Yabashi, M; Yao, M; Ueda, K
• Is Part Of: Journal of physics. Volume 49:Number 3(2016:Feb. 01)
• Publication Date: 2016-01-08
• Subjects: rare-gas cluster -- nanoplasma -- XFEL; Atoms -- Periodicals; Molecules -- Periodicals; Optics -- Periodicals; Nuclear physics -- Periodicals; 539.6
• DOI: 10.1088/0953-4075/49/3/034004
• Languages: English
• ISSNs: 0953-4075

Abstract

Abstract: We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.