Experimental Route to Scanning Probe Hot‐Electron Nanoscopy (HENs) Applied to 2D Material. Issue 15 (8th June 2017)

• Record Type: Journal Article
• Authors: Giugni, Andrea; Torre, Bruno; Allione, Marco; Das, Gobind; Wang, Zhenwei; He, Xin; Alshareef, Husam N.; Di Fabrizio, Enzo
• Is Part Of: Advanced optical materials. Volume 5:Issue 15(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-06-08
• Subjects: hot‐electrons nanoscopy -- MoS2–SnO vdW heterojunction -- nanoscale characterization -- surface plasmon polaritons; Optical materials -- Periodicals; Photonics -- Periodicals; 620.11295
• DOI: 10.1002/adom.201700195
• Languages: English
• ISSNs: 2195-1071

Abstract

Abstract : This paper presents details on a new experimental apparatus implementing the hot electron nanoscopy (HENs) technique introduced for advanced spectroscopies on structure and chemistry in few molecules and interface problems. A detailed description of the architecture used for the laser excitation of surface plasmons at an atomic force microscope (AFM) tip is provided. The photogenerated current from the tip to the sample is detected during the AFM scan. The technique is applied to innovative semiconductors for applications in electronics: 2D MoS2 single crystal and a p‐type SnO layer. Results are supported by complementary scanning Kelvin probe microscopy, traditional conductive AFM, and Raman measurements. New features highlighted by HEN technique reveal details of local complexity in MoS2 and polycrystalline structure of SnO at nanometric scale otherwise undetected. The technique set in this paper is promising for future studies in nanojunctions and innovative multilayered materials, with new insight on interfaces. Abstract : Hot‐electron nanoscopy (HENs) is used for the characterization of innovative semiconductors for applications in electronics: 2D MoS2 single crystal and a p‐type SnO layer. The results are supported by complementary scanning Kelvin probe microscopy, traditional conductive atomic force microscopy (AFM) and Raman spectroscopy measurements. HENs reveals new features of local complexity in MoS2 and polycrystalline structure of SnO at nanometric scale otherwise undetected.