Hot‐Electron Nanoscopy: Experimental Route to Scanning Probe Hot‐Electron Nanoscopy (HENs) Applied to 2D Material (Advanced Optical Materials 15/2017). Issue 15 (2nd August 2017)

• Record Type: Journal Article
• Authors: Giugni, Andrea; Torre, Bruno; Allione, Marco; Das, Gobind; Wang, Zhenwei; He, Xin; Alshareef, Husam N.; Di Fabrizio, Enzo
• Is Part Of: Advanced optical materials. Volume 5:Issue 15(2017)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-08-02
• Subjects: hot‐electrons nanoscopy -- MoS2–SnO vdW heterojunction -- nanoscale characterization -- surface plasmon polaritons; Optical materials -- Periodicals; Photonics -- Periodicals; 620.11295
• DOI: 10.1002/adom.201770078
• Languages: English
• ISSNs: 2195-1071

Abstract

Abstract : Taking advantage of the enhanced interaction of light with metallic nanostructures, hot‐electron nanoscopy (HEN) is introduced by Enzo Di Fabrizio and co‐workers in article number1700195 . HEN is a viable method for nanolocalization of electromagnetic energy, which overcomes fundamental limits of previous techniques. The proposed complementary multi‐spectroscopy scanning‐probe apparatus is expected to play a key role in relating the functional and structural properties of matter at the nanoscale.