Effect on the electrical and morphological properties of Bi incorporation into ZnO:Ga and ZnO:Al thin films deposited by confocal magnetron sputtering. (June 2018)
- Record Type:
- Journal Article
- Title:
- Effect on the electrical and morphological properties of Bi incorporation into ZnO:Ga and ZnO:Al thin films deposited by confocal magnetron sputtering. (June 2018)
- Main Title:
- Effect on the electrical and morphological properties of Bi incorporation into ZnO:Ga and ZnO:Al thin films deposited by confocal magnetron sputtering
- Authors:
- Correia, F.C.
Salvador, P.B.
Ribeiro, J.M.
Mendes, A.
Tavares, C.J. - Abstract:
- Abstract: This paper reports the effect on the electrical and morphological properties of co-doping ZnO thin films with Bi and Al or Ga. To do so, a confocal sputtering geometry was used with a Bi target and two intrinsically doped ZnO:Ga and ZnO:Al targets. By depositing at an intentional heating of 200 °C and applying a post-deposition thermal treatment at 350 °C and 300 °C, for ZnO:Ga, Bi and ZnO:Al, Bi, respectively, electrical resistivity values of 1.3 × 10 −3 Ω cm and 4.8 × 10 −4 Ω cm were achieved, with an optical transmittance above 80%. The X-ray diffraction data shows that all doped ZnO films have a wurtzite hexagonal structure with preferential crystal growth perpendicular to the (002) plane. The Seebeck coefficient was measured for the ZnO:Al, Bi films, where a maximum value of −48 μV K −1 was registered. The optimized electrical properties were correlated with the preferential crystalline texture along [001] and the corresponding current density applied to the Bi dopant target, J(Bi). ZnO:Al, Bi films present out-of-plane compression stress, which concomitantly increases with J(Bi), due to higher compact volume of unit cell with lower lattice parameter c when compared with the undoped ZnO. By controlling the incorporation of Bi, the deposition temperature and the post-deposition thermal treatment temperature, improvements on the thermoelectric power factor of ZnO:Ga and ZnO:Al thin films can be achieved. Highlights: ZnO:Ga, Bi and ZnO:Al, Bi thermoelectricAbstract: This paper reports the effect on the electrical and morphological properties of co-doping ZnO thin films with Bi and Al or Ga. To do so, a confocal sputtering geometry was used with a Bi target and two intrinsically doped ZnO:Ga and ZnO:Al targets. By depositing at an intentional heating of 200 °C and applying a post-deposition thermal treatment at 350 °C and 300 °C, for ZnO:Ga, Bi and ZnO:Al, Bi, respectively, electrical resistivity values of 1.3 × 10 −3 Ω cm and 4.8 × 10 −4 Ω cm were achieved, with an optical transmittance above 80%. The X-ray diffraction data shows that all doped ZnO films have a wurtzite hexagonal structure with preferential crystal growth perpendicular to the (002) plane. The Seebeck coefficient was measured for the ZnO:Al, Bi films, where a maximum value of −48 μV K −1 was registered. The optimized electrical properties were correlated with the preferential crystalline texture along [001] and the corresponding current density applied to the Bi dopant target, J(Bi). ZnO:Al, Bi films present out-of-plane compression stress, which concomitantly increases with J(Bi), due to higher compact volume of unit cell with lower lattice parameter c when compared with the undoped ZnO. By controlling the incorporation of Bi, the deposition temperature and the post-deposition thermal treatment temperature, improvements on the thermoelectric power factor of ZnO:Ga and ZnO:Al thin films can be achieved. Highlights: ZnO:Ga, Bi and ZnO:Al, Bi thermoelectric thin films. Enhancement of power factor with Bi doping. Highest electrical conductivity and power factor correlated with enhancement in film crystallinity. … (more)
- Is Part Of:
- Vacuum. Volume 152(2018)
- Journal:
- Vacuum
- Issue:
- Volume 152(2018)
- Issue Display:
- Volume 152, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 152
- Issue:
- 2018
- Issue Sort Value:
- 2018-0152-2018-0000
- Page Start:
- 252
- Page End:
- 260
- Publication Date:
- 2018-06
- Subjects:
- Thin films -- ZnO -- Seebeck coefficient -- Thermoelectric -- TCO
Vacuum -- Periodicals
621.55 - Journal URLs:
- http://www.elsevier.com/journals ↗
http://www.sciencedirect.com/science/journal/0042207X ↗ - DOI:
- 10.1016/j.vacuum.2018.03.033 ↗
- Languages:
- English
- ISSNs:
- 0042-207X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 9139.000000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 9164.xml