Cite
HARVARD Citation
Lotnyk, A. et al. (2015). Focused high- and low-energy ion milling for TEM specimen preparation. Microelectronics and reliability. 55 (9), pp. 2119-2125. [Online].
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Lotnyk, A. et al. (2015). Focused high- and low-energy ion milling for TEM specimen preparation. Microelectronics and reliability. 55 (9), pp. 2119-2125. [Online].