Cite
HARVARD Citation
Adokanou, K. et al. (2015). Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices. Microelectronics and reliability. 55 (9), pp. 1697-1702. [Online].
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Adokanou, K. et al. (2015). Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices. Microelectronics and reliability. 55 (9), pp. 1697-1702. [Online].