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HARVARD Citation
Stellhorn, J. et al. (2019). Application of X‐ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film. Surface and interface analysis. pp. 70-73. [Online].
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Stellhorn, J. et al. (2019). Application of X‐ray fluorescence holography to the analysis of the interior and surface of an yttrium oxide thin film. Surface and interface analysis. pp. 70-73. [Online].