Characterization at the Level of Individual Crystals: Single‐Crystal MFI Type Zeolite Grains. Issue 10 (17th January 2018)

• Record Type: Journal Article
• Authors: Gruene, Tim; Li, Teng; van Genderen, Eric; Pinar, Ana B.; van Bokhoven, Jeroen A.
• Is Part Of: Chemistry. Volume 24:Issue 10(2018)
• Page Start: 2384
• Page End: 2388
• Publication Date: 2018-01-17
• Subjects: electron diffraction -- structure–performance relationship -- X-ray diffraction -- zeolites; Chemistry -- Periodicals; 540
• DOI: 10.1002/chem.201704213
• Languages: English
• ISSNs: 0947-6539

Abstract

Abstract: Electron‐diffraction data on the zeolites Silicalite‐1 and ZSM‐5 (both MFI framework type) were collected from individual grains of about 150×100×50 nm 3 . Crystals were synthesized with tetrapropylammonium as structure‐directing agent. The resolution extended to about 0.8 Å for Silicalite‐1 and about 0.9–1.0 Å for ZSM‐5 crystals. Analysis of several data sets showed that at the nanometre‐scale, these zeolite crystals are single crystals and not intergrown. Abstract : Electron‐diffraction data on the zeolites Silicalite‐1 and ZSM‐5 (both MFI framework type) were collected from individual grains of about 150×100×50 nm 3 . Crystals were synthesized with tetrapropylammonium as structure‐directing agent. Analysis of several data sets showed that at the nanometer‐scale, these zeolite crystals are single crystals and not intergrown (see scheme).