Charge-induced formation of thin conducting layers on fluorinated graphite surface. (February 2015)

• Record Type: Journal Article
• Authors: Asanov, Igor P.; Okotrub, Alexander V.; Gusel'nikov, Artem V.; Yushina, Irina V.; Vyalikh, Denis V.; Bulusheva, Lyubov G.
• Is Part Of: Carbon. Volume 82(2015)
• Page Start: 446
• Page End: 458
• Publication Date: 2015-02
• Subjects: Carbon -- Periodicals; Carbone -- Périodiques; Koolstof; Toepassingen; Electronic journals; 546.681
• DOI: 10.1016/j.carbon.2014.10.088
• Languages: English
• ISSNs: 0008-6223

Abstract

Abstract: We show that irradiation of room-temperature fluorinated graphite of C2 F composition by electron beam with a kinetic energy of 500 eV detaches the fluorine atoms from two or three top layers. The dielectric property of C2 F prevents effective penetration of the beam in depth of the sample, and electrons are accumulated between the interior layers. Comparative study of the initial C2 F sample and that after irradiation by means of X-ray photoelectron, X-ray absorption near edge structure, Raman and reflection optical spectroscopy detects a partial recovering of the π-bonds which increases the surface conductivity by more than three orders. The mechanism responsible for removal of fluorine atoms from dielectric matrix under electron irradiation is proposed and substantiated by quantum chemical calculations.