Advanced techniques for characterization of ion beam modified materials. Issue 1 (February 2015)
- Record Type:
- Journal Article
- Title:
- Advanced techniques for characterization of ion beam modified materials. Issue 1 (February 2015)
- Main Title:
- Advanced techniques for characterization of ion beam modified materials
- Authors:
- Zhang, Yanwen
Debelle, Aurélien
Boulle, Alexandre
Kluth, Patrick
Tuomisto, Filip - Abstract:
- Highlights: Technical advances based on ion/electron/positron-solid interactions are reviewed. Advances in analysis techniques based on photon-solid interaction are reviewed. Ion beam modified materials are characterized at scale of atoms and electrons. Such insights are essential for enhancing material performance and for synthesis of new materials. Abstract: Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiation effects in modified depths ranging from a few nm to a few tens of μm, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Such knowledge contributes to our fundamental understandingHighlights: Technical advances based on ion/electron/positron-solid interactions are reviewed. Advances in analysis techniques based on photon-solid interaction are reviewed. Ion beam modified materials are characterized at scale of atoms and electrons. Such insights are essential for enhancing material performance and for synthesis of new materials. Abstract: Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiation effects in modified depths ranging from a few nm to a few tens of μm, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Such knowledge contributes to our fundamental understanding over a wide range of extreme conditions essential for enhancing material performance and also for design and synthesis of new materials to address a broad variety of future energy applications. … (more)
- Is Part Of:
- Current opinion in solid state & materials science. Volume 19:Issue 1(2015)
- Journal:
- Current opinion in solid state & materials science
- Issue:
- Volume 19:Issue 1(2015)
- Issue Display:
- Volume 19, Issue 1 (2015)
- Year:
- 2015
- Volume:
- 19
- Issue:
- 1
- Issue Sort Value:
- 2015-0019-0001-0000
- Page Start:
- 19
- Page End:
- 28
- Publication Date:
- 2015-02
- Subjects:
- Rutherford backscattering spectrometry -- Raman spectroscopy -- X-ray diffraction -- Small-angle X-ray scattering -- Positron annihilation spectroscopy -- Ion beam modification
Materials science -- Periodicals
Solid state physics -- Periodicals
620.11 - Journal URLs:
- http://www.sciencedirect.com/science/journal/13590286 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.cossms.2014.09.007 ↗
- Languages:
- English
- ISSNs:
- 1359-0286
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 3500.778300
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 9060.xml