Characterization of novel BaZnSnO thin films by solution process and applications in thin film transistors. (August 2015)

• Record Type: Journal Article
• Authors: Li, Jun; Huang, Chuan-Xin; Zhang, Jian-Hua; Zhu, Wen-Qing; Jiang, Xue-Yin; Zhang, Zhi-Lin
• Is Part Of: Materials research bulletin. Volume 68(2015:Aug.)
• Page Start: 22
• Page End: 26
• Publication Date: 2015-08
• Subjects: A. Amorphous materials -- B. Sol–gel chemistry -- D. Electrical properties; Materials -- Periodicals; Crystal growth -- Periodicals; Matériaux -- Périodiques; Cristaux -- Croissance -- Périodiques; Crystal growth; Materials; Periodicals; 620.11
• DOI: 10.1016/j.materresbull.2015.03.036
• Languages: English
• ISSNs: 0025-5408

Abstract

Graphical abstract: This work reports the Ba content on thin film transistor based on a novel BaZnSnO semiconductor using solution process. Highlights: No reports about BaZnSnO thin film using solution process. BaZnSnO thin film transistor (TFT) was firstly fabricated. BaZnSnO-TFT shows a acceptable performace. Influence of Ba content on BaZnSnO-TFT. Abstract: A novel BaZnSnO semiconductor is fabricated using solution process and the influence of Ba addition on the structure, the chemical state of oxygen and electrical performance of BaZnSnO thin films are investigated. A high performance BaZnSnO-based thin film transistor with 15 mol% Ba is obtained, showing a saturation mobility of 1.94 cm 2 /V s, a threshold voltage of 3.6 V, an on/off current ratio of 6.2 × 10 6, a subthreshold swing of 0.94 V/decade, and a good bias stability. Transistors with solution processed BaZnSnO films are promising candidates for the development of future large-area, low-cost and high-performance electronic devices.