Cite
HARVARD Citation
Reimann, C. et al. (2015). Response of as grown dislocation structure to temperature and stress treatment in multi-crystalline silicon. Acta materialia. pp. 129-137. [Online].
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Reimann, C. et al. (2015). Response of as grown dislocation structure to temperature and stress treatment in multi-crystalline silicon. Acta materialia. pp. 129-137. [Online].